Impact Factor
3.57
Journal Citation Impact
Estimated influence, citation density, publishing volume, and citation integrity from the analytics table.
Citation rate
3.23
781 total citations
h5-index
31
h5 depth signal
Cited share
77.8%
203 of 261
Total citations
781
Citation footprint
Metric signal
3.43
External metric anchor
Self-citation
6.5%
51 self-citations
Citations Trend
Monthly Publications Cadence
Citing Geographic Demographics
United States
384
Germany
334
China
221
United Kingdom
181
Japan
140
Citing Fields of Research
Nuclear Technology & Instrumentation
914
Nanotechnology
791
Material Physics
390
Microelectromechanical Systems
214
Geometrical Optics
213
Publishing Activity & Reach
Volume, recency, access pattern, and citing-community signals from the journal analytics record.
All-time article footprint
9,743
Articles tracked across the journal lifetime
Indexed publication set
261
203 cited publications
Last 12 months
133
11.1 publications/month
Open access share
45.9%
61 OA publications in the last year
Leading citing country
United States
384 citing publications
Leading citing field
Nuclear Technology & Instrumentation
914 citing publications
Latest tracked publication
19 October 2026
10 recent records available
Coverage & Indexing History
v1n1,Jan. 1975-
v1n1,Jan. 1975-
Active Coverage
Research Focus & Classification
Indexed Subjects
Nuclear Technology & Instrumentation
Nanotechnology
Microelectromechanical Systems
Material Physics
Laser Physics
Broad Categories
Diagnostic Imaging
Nuclear Technology & Instrumentation
MeSH Descriptors
Microscopy
Microscopy, Electron
Latest Publications
Recent article records with DOI-first linking and condensed abstracts.
01
DOI 10.1016/j.ultramic.2026.114462
Open DOI
Controlling charge, energy spread, and pulse duration in an ultrafast scanning electron microscope
02
DOI 10.1016/j.ultramic.2026.114460
Open DOI
Electrostatic multipolar probe-forming objective lens for FIB
03
DOI 10.1016/j.ultramic.2026.114452
Open DOI
Pushing the dose limit of atomic-resolution imaging: A 4D-STEM case study of NaCl
04
DOI 10.1016/j.ultramic.2026.114451
Open DOI
A differential algebra computational framework for high-order aberration analysis of electromagnetic lenses
05
DOI 10.1016/j.ultramic.2026.114453
Open DOI
Study on nonlinear spatial stitching method of SICM images based on adaptive region candidates
06
DOI 10.1016/j.ultramic.2026.114448
Open DOI
An Approach for the aberration calculation of multi-electron-beam systems
07
DOI 10.1016/j.ultramic.2026.114450
Open DOI
Picometre-scale real-time drift correction in TEM and STEM by dynamic control of the specimen stage for atomic-resolution imaging
08
09
10
DOI 10.1016/j.ultramic.2026.114446
Open DOI
High resolution large working distance scanning helium microscopy
Bibliographical & Catalog Notes
Also issued online.
Vol. 1 (1975)19891024 Notice published Printed on acid-free paper